JFK International Airport

Collection of airport pavement information can be a hard and time consuming project. Not to mention the interruptions it can cause in day-to-day runway operations. Mandli has come up with a system to collect the entire width of the runway in a fraction of the time and with minimal disruptions to traffic by using drive-by-wire technology and a high definition Laser Crack Measurement System (LCMS). The resulting dataset gives the end user a 3D view of the pavement and all its attributes with ± 1cm accuracy the entire width of the runway.

Mandli Communications

2655 Research Park Drive  |  Fitchburg  WI  53711 

(42.999149° N,89.427252° W)

(P) 608-835-3500 (P) 608-835-3500
(F) 888-545-2214